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сонда
Electrical test of semiconductor devices at the wafer level, so named because a metal probe is used to make electrical contact with each of the device's bonding pads.
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- Part of Speech: noun
- Synonym(s):
- Blossary:
- Industry/Domain: Semiconductors
- Category: Semiconductor quality
- Company: National Semiconductor
- Product:
- Acronym-Abbreviation:
Other Languages:
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